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Analytical Instruments Compact XRD System with Versatile Capabilities

Editor: Alexander Stark

Malvern Panalytical launches a new version of its Aeris compact X-ray diffractometer (XRD). This new version contains capabilities previously only seen in much larger systems, the company states.

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The Aeris XRD is a compact system that provides high quality data from polycrystalline materials.
The Aeris XRD is a compact system that provides high quality data from polycrystalline materials.
(Source: Malvern Panalytical)

Building on the family of compact Aeris XRD systems which provide high quality data from polycrystalline materials at competitive speeds, the new Aeris model is designed for use in all environments. Specifically, grazing-incidence XRD (GIXRD) are to enable the examination of thin films and coatings, while transmission measurements provide more accurate data that are not affected by sample preparation artefacts.

According to the company, its straightforward operational interface simplifies XRD measurements for the user. The performance of the Aeris is similar to floor standing systems. It does not require any external supplies and infrastructure and is highly cost effective. The system can be used in a regulated environment with Omni Trust software.

Even with expanding capability range, operators will be able to switch between different applications. Researchers can obtain detailed, accurate data more easily and affordably, opening possibilities for smaller companies in the pharmaceutical and coatings industries, as well as educational institutions, to contribute to scientific research and process development.

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