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The Linkam LTS420 – Sensofar’s S neox system with Linnik in use in the lab (Linkam)
Spain: Profilometry Experiments

New Technique Allows Characterisation of Temperature Induced Changes in Nanoscale Materials

Sensofar has developed a new technique for characterising the evolution of a sample’s surface topography with temperature using the S neox 3D optical profiler and Linnik interferometer coupled with Linkam’s LTS420 temperature-controlled chamber. The technique has been used to successfully map the changes in roughness and waviness of silicon wafers at temperatures up to 380 °C.

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