German China
The Linkam LTS420 – Sensofar’s S neox system with Linnik in use in the lab (Linkam)
Spain: Profilometry Experiments

New Technique Allows Characterisation of Temperature Induced Changes in Nanoscale Materials

Sensofar has developed a new technique for characterising the evolution of a sample’s surface topography with temperature using the S neox 3D optical profiler and Linnik interferometer coupled with Linkam’s LTS420 temperature-controlled chamber. The technique has been used to successfully map the changes in roughness and waviness of silicon wafers at temperatures up to 380 °C.

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Chiral, stacked nanoparticle lines efficiently filter light polarizations. They allow only left-circularly polarized light to pass (blue) and retain right-circularly polarized light (red). (Martin Mayer)
Germany: Optical Analysis

New and Efficient Method of Fabrication for Optically Active Nano-Layers

In an article by Patrick Probst et al. published in Nature Materials, researchers led by Prof. Dr. Andreas Fery and Dr. Tobias A.F. König of the Leibniz Institute of Polymer Research Dresden describe a new design strategy for the fabrication of thin nanostructured films for active control of circularly polarized light. It is based on chiral nanoassembly by stacking two substrates with nanoparticle chains.

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